Pii: S0026-2692(00)00022-7
نویسندگان
چکیده
According to noise sources of optoelectronic coupled devices (OCDs) and device reliability estimation method, a screening threshold is proposed for OCDs, which can be used to screen potential devices with excess noise, such as 1/f, g–r and burst noise. By this method, the device reliability can be improved and high reliability requirements can be met. The experimental results show that the method is of practical value. q 2000 Elsevier Science Ltd. All rights reserved.
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